Cantilever-based NSOM/SNOM probes

Combined AFM/SNOM image of a human chromosome (image: AG Hartmann, University of Saarbrücken) AFM/SNOM: human Chromosome

We produce cantilever-based probes for near-field scanning optical microscopy (NSOM, also known as SNOM) with customized aperture size. Using the unique technology and know-how of the former NASCATEC team we replace the solid silicon tip of AFM cantilevers by a hollow pyramid with an aperture size which can be adapted to meet application specific demands. The most commonly used sizes are 50 nm and 100 nm. Compared to fiber-based NSOM probes, the cantilever-based probes show much higher light transmission, up to a factor of 100 and puts the user in a position to probe the topography of surfaces with a resolution comparable to standard AFM.

As formerly it was NASCATEC, today NMI-TT is the only manufacturer of those probes worldwide. NASCATEC probes have been applied and validated in recent years by many users for surface investigation in nano- and biotechnology.

Our cantilever-based silicon probes utilizes a hollow, aluminum-coated, pyramidal tip with a small aperture at the apex to focus the SNOM beam. Aluminium-coated tip

We deliver to manufactures of instruments and accessories for Scanning Probe Microscopy as well as to OEM resellers and end users.

Product information sheet