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NMI-TT Contact Person

Dr. Claus Burhardt

+49 7121 51530 55

Wafer processing of cantilver-based SNOM probes

Cantilever-based NSOM/SNOM probes

We produce cantilever-based probes for near-field scanning optical microscopy (NSOM, also known as SNOM) with customized aperture size. The solid silicon tip of AFM cantilevers is replaced by a hollow pyramid with an aperture size which can be adapted to meet application specific demands. The most commonly used sizes are 50 nm and 100 nm. Compared to fiber-based NSOM probes, the cantilever-based probes show much higher light transmission, up to a factor of 100 and puts the user in a position to probe the topography of surfaces with a resolution comparable to standard AFM.

For sales inquiries please contact the distristribution partner below who is responsible for your country.
Otherwise, please contact us directly.

Product information sheet

Distribution partner



Schaefer Group

A.P.E. Research

Mr. Suresh Babu
Phone: +91 (0)9343002868
Fax: +91 (0)9743232324


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NMI TT is a subsidiary of NMI